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Derniers dépôts
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Nombre de documents
83
Nombre de notices
294
Mots-clés
Capacitance
Plasma etching
CNTs’ collapse
Thin film
Functionalization
AlN
Aryl-diazonium salts
Thin films
Band gap
Mott insulator
Adsorption
Nanotubes
Argon InP chlorine etching inductive coupled plasma ICP modeling plasma sheath simulation
SF 6
TiO2
A Multilayers
Chalcogenide
Buffer Couple
Carbon Nanotube
Amorphous
Applications industrielles
A3 Physical vapor deposition processes
Bixbyite
Rutile
A1 Characterization
Spectroscopic ellipsometry
XPS
Biomembranes
Oxides
Atomic force microscopy
Non-volatile memory
B2 Semiconducting indium compounds
AuCu alloy
Transfert d'énergie
V2O3
Integrated optics
B3 Solar cells
X-ray photoelectron spectroscopy
X-ray diffraction
Physical vapor deposition
Selenization
B Chemical synthesis
CH4
Alloying
Mott insulators
Sol-gel
Biomasse
Biofilms microbiens
Scanning electron microscopy
Vanadium Sesquioxide
TEM
Biocapteurs
Alzheimer's disease
Structure
Films
Ablation laser
BOMBARDMENT
Low-pressure plasma processing
Residual stress
Optical interferometry
Calcined clay
Annealing
A Chalcogenides
AZO thin films
Titanium dioxide
CIGSe
Optical waveguides
A-CNx
B2 Quaternary
Amyloid precursor
NEXAFS
Atomic layer etching
Aluminium nitride
Ambipolar material
CaTiO3Pr^3^+
Optical properties
Copper
Kirkendall effect
Magnetron sputtering
C Photoelectron spectroscopy
Anatase
B2 Semiconducting alloys
3 nm in size
Plasmas froids
Resistive switching
PECVD
Bipolar resistive switching BRS
Nanocomposite
CHLORINE PLASMAS
A Thin films
Colloidal solution
Avalanche breakdown
Etching
Transmission electron microscopy
Sputtering
Band alignment
B1 Inorganic compounds
Mass spectrometry
Semiconductors
Carbon